Germanium quantum wells on silicon
Germanium quantum well (QW) structures are based on commercially available silicon wafers, but the QW cannot be grown directly on silicon. A feature of the silicon-germanium material system is strain. While both silicon and germanium form the same diamond-like crystal structure, the lattice parameter of germanium is 4.2% larger than that of silicon. We want the germanium to grow in a uniform 2-dimensional layer – “Frank–van der Merwe” growth – but actually after the first few monolayers the germanium would form of 3-dimensional structures – “Stranski–Krastanov growth” – because of the strain. So to grow a strained Ge QW on silicon we need a SiGe “buffer” which relaxes the strain as it grows. LEPECVD in Como can grow buffers graded from pure Si up to the final SiGe content of 70%, whereas the other groups use CVD to first deposit a thick Ge layer and then grade back down to 80%.
Prerequisite knowledge
- Semiconductors
- Epitaxy
- Hooke’s law, stress and strain
Main takeaways
- Ge QWs cannot be grown directly on Si.
- By LEPECVD we can grow forward-graded buffers but these are very thick.
- These would take too long to grow by CVD, so other groups deposit a thick Ge layer and then use reverse-grading to reach an alloy suitable for a strained Ge QW.
Futher thinking
True or False: The roughness of the virtual substrate is critical because if the peak-valley roughness range reaches values similar to the QW thickness, the QW may be physically isolated into detached regions.
Further reading
The LEPECVD growth system is reviewed in G. Isella et al., Low-energy plasma-enhanced chemical vapor deposition for strained Si and Ge heterostructures and devices. Solid State Electron. 48 (8) 1317--1323 (2004) http://dx.doi.org/10.1016/j.sse.2004.01.013
Reverse grading is presented in V. A. Shah et al., Reverse graded relaxed buffers for high Ge content SiGe virtual substrates. Appl. Phys. Lett. 93 (19) 192103 (2008) https://doi.org/10.1063/1.3023068